ARCHIVE CONTENTThe content below is no longer current and may not be applicable or relevant.
Catch up with the latest test technology and discuss your production test issuesWHAT: Test and Debug exhibition and seminars
WHEN: From 9AM, Tuesday, March 26th 2019
WHERE: Keele Hall, Keele University, ST5 5BG
HOW: please register at www.electrotestexpo.co.uk
HOW MUCH: Free to attend
This event is organized and manned by engineers for engineers. An inspiring seminar program will cover a wide range of test topics and there will be experts in many fields to chat to. From JTAG/Boundary Scan to AOI and system switching, we have the technology that you need to know about. The event is free to attend and refreshments will be provided.
- Exhibitions of the latest bench T&M and ATE
- Device programming solutions for flash, FPGAs and micros
- RF instrumentation
- PXI and JTAG based ATE
- Inspection (AOI) systems
- Central location and free parking
- Free consultations with industry experts
Posted Tuesday 15th of January 2019